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ATOMIC FORCE MICROSCOPE AFM Read more

ATOMIC FORCE MICROSCOPE AFM

The atomic force microscope allows to measure the topography of various materials down to atomic resolution.

SCANNING TUNNELING MICROSCOPE STM Read more

SCANNING TUNNELING MICROSCOPE (STM)

The Scanning Tunneling Microscope allows to measure the topography of metals, the position of their atoms, and the electron characteristics in the metal.

TRANSMISSION ELECTRON MICROSCOPE TEM Read more

Transmission Electron Microscope (TEM)

The Transmission Electron Microscope allows to get magnified images of very thin samples and to analyze their composition.

SCANNING ELECTRON MICROSCOPE SEM Read more

SCANNING ELECTRON MICROSCOPE (SEM)

The Scanning Electron Microscope allows to get strongly magnified images of the surface of thick samples and to analyze their composition.

FLUORESCENT AND CONFOCAL Read more

Fluorescent and confocal microscopies

The fluorescence microscope allows to detect the presence and localization of fluorescent molecules in the sample. The confocal microscope is a specific fluorescent microscope that allows obtaining 3D images of the sample with good resolution.

DARK FIELD AND PHASE CONTRAST Read more

Dark field and phase contrast microscopes

Dark field and phase contrast microscopes allow to observe transparent samples.

POLARIZING MICROSCOPE Read more

Polarizing microscope

A polarizing microscope allows to image and characterize birefringent samples.